Prof. Dr. Wolfgang Osten
University of Stuttgart, ITO,Germany
Prof. Wolfgang Osten received the MSc/Diploma in Physics from the Friedrich-Schiller-University Jena in 1979. From 1979 to 1984 he was a member of the Institute of Mechanics in Berlin working in the field of experimental stress analysis and optical metrology. In 1983 he received the PhD degree from the Martin-Luther-University Halle-Wittenberg for his thesis in the field of holographic interferometry. From 1984 to 1991 he was employed at the Central Institute of Cybernetics and Information Processes ZKI in Berlin making investigations in digital image processing and computer vision. Between 1988 and 1991 he was heading the Institute for Digital Image Processing at the ZKI. In 1991 he joined the Bremen Institute of Applied Beam Technology (BIAS) to establish and to direct the Department Optical 3D-Metrology till 2002. Since September 2002 he has been a full professor at the University of Stuttgart and director of the Institute for Applied Optics. From 2006 till 2010 he was the vice rector for research and technology transfer of the Stuttgart University where he is currently an elected member of the university council. His research work is focused on new concepts for industrial inspection and metrology by combining modern principles of optical metrology, sensor technology and image processing. Special attention is directed to the development of resolution enhanced technologies for the investigation of micro and nano structures.
Title: "Optical metrology in the conflict between desire and reality: Challenges and Solving Strategies"
Abstract:In the context of measurement technology, optical methods have a number of unique features. To them belong in particular the non-contact and high speed interaction with the object under test, the largely free scalability of the dimension of the probing tool, the high resolution of the data, the diversity of information channels in the light field, and the flexible adaptability of the comparative standard. On the other hand we are confronted with non-negligible drawbacks. Here one should mention especially the indirect nature of the measurement. This fact is the origin of a number of serious consequences which make it often difficult for the practitioner to decide for optical metrology. Furthermore should not be neglected that optical principles show high sensibility to harsh environmental conditions. As a consequence, the transition from the laboratory to the industrial environment is often an adventure. However, one of the biggest challenges that currently attracts high attention both in the technical and life sciences, is dedicated to the goal of exceeding the physical limits of resolution. Nowadays people prefer to talk about super-resolution, although that term generates an expectation that reduces itself in many cases simply to the approach to the diffraction limit or to a more or less skilful impulse response design. Not to forget are those negative consequences that arise from the high information density in optical signals. The nature of light and its fascinating interaction with matter, which made our visual sense on the one hand to the most valuable information carrier, hinders on the other hand often the metrologically correct interpretation of the results. Nevertheless, it can be proven by numerous examples that no alternative to optical principles exists ¨C especially if extended surfaces have to be investigated with high spatial and temporal resolution. In particular, the implementation of the 6-sigma standard presupposes an inspection coverage which is hardly to ensure by conventional measures. Because critical structures are getting smaller and functional surfaces are becoming increasingly complex, the wavelength of light provides the most flexible and traceable standard to cope with these challenges. However, the potential that is inherent in the optical methods, seduces too often to overload the wish list or to make unrealistic promises. Therefore, this lecture is dedicated to the tension between desire and reality in optical measuring techniques. By using examples from the inspection of tiny semiconductor structures, from the non-destructive testing of various materials and the measurement of complex functional surfaces we will try to objectify this conflict and to explore strategies to face the current challenge.
Human and Artificial Intelligent Systems, Graduate School of Engineering, University of Fukui, Japan
Prof. Motoharu Fujigaki received his BE and ME degrees in mechanical engineering from Osaka University in 1990 and 1992, respectively. He received his doctoral degree from Osaka University in 2001. He was working in NABCO Ltd. from 1992 to 1995. He moved to Department of Opto-Mechatronics, Faculty of Systems Engineering, Wakayama University in 1995 as a research associate. He became an associate professor in 2003. He moved to Human and Artificial Intelligent Systems, Graduate School of Engineering, University of Fukui as a full professor in 2015. He is interested in optical metrology using image processing, especially 3D shape measurement using gating projection method, deformation measurement using phase analysis method used for structural health monitoring and small displacement and strain distribution measurement using laser interferometry. He is a chairperson of the Whole-Space Measurement and Inspection Consortium, an executive board member of The Japanese Society for Experimental Mechanics (JSEM), and a steering committee member of Asian Society of Experimental Mechanics (ASEM).
Prof.Byoungho Lee,(SPIE/OSA/IEEE Fellow, KAST Member)
School of Electrical and Computer Engineering, Seoul National University, Korea.
Prof. Byoungho Lee received the Ph.D. degree in electrical engineering and computer science from the University of California at Berkeley, Berkeley, CA, USA, in 1993. In 1994, he joined the Faculty of the School of Electrical and Computer Engineering, Seoul National University, Seoul, Korea, where he is currently serving as the Head. He has been on the Board of Directors of the Optical Society of America (OSA) and the Chair of the MES Council of OSA. He is currently on the editorial board of the journals Light: Science & Applications and Applied Physics B. His group has published more than 360 international journal papers and more than 650 international conference papers, including more than 120 invited presentations. His current research interests include 3D displays and diffractive optics for nanostructures and metamaterials. Prof. Lee is a Fellow of the SPIE, OSA and IEEE. Also, he is a Member of the Korean Academy of Science and Technology.
Title: "Optical tools for augmented reality"
Abstract:Augmented reality (AR) is a technology to integrate digital information with real-world environment. AR is regarded as a next-generation display technology and service platform with the advances in computer science and optical engineering. Indeed, wearable or head-mounted displays (HMD) with AR have drawn a lot of public attention. Here, we introduce optical tools to realize displays with AR. In particular, my talk will focus on implementation of see-through three-dimensional (3D) displays that can be applied to AR. First, a see-through 3D display using chromatic half-mirror array (CHMA) will be described. Fabrication process, principle, and a prototype of CHMA will be explained. Second, realization of AR systems using holographic optical elements (HOEs) will be introduced. HOEs are transparent elements that transform a specific incident wavefront to a predefined wavefront. HOEs have various advantages such as angular selectivity and ability of spatial and wavelength multiplexing as well as transparency. Our recent work that combines compressive light field display and HOE will also be explained.
Prof.Perry Shum, School of EEE, Nanyang Technological University, Singapore
Prof Shum received his PhD degree in Electronic and Electrical Engineering from the University of Birmingham, UK, in 1995. In 1999, he joined the School of Electrical and Electronic Engineering, NTU. Since 2014, he has been appointed as the Director of Centre for Optical Fibre Technology and was the chair, committee member and international advisor of many international conferences. He was also the founding member of IEEE Photonics Society Singapore Chapter (formerly IEEE LEOS). He is currently the chairman of OSA Singapore Chapter. Prof Shum has published more than 500 journal and conference papers with his research interests being in the areas of speciality fibres and fibre-based devices. His H-index is 30. In recent few years, his publications have been cited about 500 times per year.
"Optical Fibre-Based Technologies and Their Applications"
Abstract: Optical fiber-based devices have been widely deployed in recent years. There are many advantages of using fiber as a sensor. These include electrically-passive operation, light weight, immunity to radio frequency interference and electromagnetic interference, high sensitivity, compact size, corrosion resistance, easily multiplexing and potentially low cost. Several novel fiber-based sensors and technologies developed are presented here, including fiber Bragg grating (FBG) based sensors, photonic crystal fiber (PCF) based sensors, specialty fiber-based sensors and distributed fiber sensing systems.
Dept of Eng. Mechanics ,Tsinghua University,China
Prof. Huimin Xie Received Ph. D in Tsinghua University, China in 1992. He is a full professor and the deputy head of Key Lab of Applied Mechanics of Ministry of Education of China in Tsinghua University. His research areas are in development of new techniques and applications in solving challenging fundamental and industrial problems in the fields of experimental solid mechanics and applied optics. He was the chairman of the Chinese Society for Experimental Mechanics (2007-2011), the steering committee member of the ACEM (Asian Society of Experimental Mechanics), associate editor for the journal of Optics and Lasers in Engineering (Elsevier Science, UK), associate Technical Editors for the journal of Experimental Mechanics (Springer, Germany), editorial board member of Strain (Blackwell Publishing, UK), The Journal of Strain Analysis for Engineering Design (Sage, USA). He undertook several important research projects including the National Science Fund for Distinguished Young Scholars, key research project of NSFC£¬integrated project of major research program (NSFC), project from the Program for New Century Excellent Talents in University. And he has published more than ninety scientific papers in academic journals.
"Moir¨¦ grating fabrication techniques based on the nanoimprint lithography and applications"
Abstract: The moir¨¦ technique is a powerful approach for
deformation measurement. As a deformation sensor for moir¨¦ experiment,
grating is crucial for a successful measurement. In this study, several
fabrication techniques for moir¨¦ grating based on the nanoimprint
lithography (NIL) are reported to prepare high frequency gratings on
various specimens. Four derivative methods of NIL, including thermal
nanoimprint lithography (T-NIL), ultra violet nanoimprint lithography
(UV-NIL), solvent-assisted micro-contact molding (SAMIM), and
solute-solvent separation soft lithography (3S soft lithography), are
selected to fabricate both the transfer gratings and zero-thickness
gratings on surfaces of different materials with frequency up to several
thousand lines per millimeter. In this study, the hybrid NIL stamps are
designed to match the specimen surface and measurement methods. And the
NIL processes are also improved to satisfy the particular requirements
of moir¨¦ grating. In addition, a multi-scale grating characterization
method is developed, which can be used for examining the grating lateral
distortion and locating the defects rapidly. In order to demonstrate the
feasibility, versatility and reliability of the fabricated gratings,
several typical applications are exhibited, including the measurements
of mechanical parameters, residual stress, crack tip opening
displacement, and thermal expansion mismatch of electronic packaging.
Keywords: Moir¨¦ grating, nanoimprint lithography, deformation measurement.
Prof.Manuel Costa,University of Minho,Portugal
Manuel F. M. Costa hold a PhD degree in Science (Physics) from the University of Minho (Portugal) where he works since 1985 at its Physics Department teaching and performing applied research in optical metrology, applied optics, nanoscience and science education and literacy. Presented over three hundred communications in international meetings and published around the same number of scientific papers, monographs and books. Editor or member of the editorial board of several scientific and educational international journals. Chairperson on eighteen international conferences. Member of the Scientific Advisory Board of EOS, of the Board of the Iberoamerican Optics Network, and of the Board of Stakeholders of PHOTONICS¡¯21. President of the Hands-on Science Network, of the Portuguese Territorial Committee of the International Commission for Optics and of the Portuguese Society for Optics and Photonics. Senior member of SPIE and fellow of European Optical Society.
"3D SURFACE INSPECTION AND REPRODUCTION"
Abstract: Non-destructive dimensional inspection of surfaces is an issue of
utmost importance in a large number of situations in R&D and at the
industrial world. An increasing number of surfaces and surface types
must be microtopographically characterized in a non-destructive
non-invasive way. Statistical parameters, both 2D and 3D, are
fundamental to a useful quantitative characterization of the surface¡¯
relief. However the two and tridimensional magnified representation of
the microtopographic structure of the surface, allowing a comfortable
and detailed visualization of the relief structure, gives very
meaningful insights and is more and more requested. Increasing computer
processing power and speed and new software allows our days a very
efficient visual inspection of the results of the microtopographic
inspection of surfaces and parts. Recently the resolution accuracy and
reliability of 3D printers is achieving rather interesting figures. It
is now possible not only to visualize, in a high resolution screen, the
amplified 3D relief structured of the surface but also it is possible to
3D print it. The ¡°tactile¡± visualization of the 3D printed physical
model of the inspected surface is an interesting experience that may
lead to a fast meaningful assessment of the relief of the inspected
surface. Optical triangulation in different approaches allow the
establishment of metrological systems that by its inherent relative
simplicity versatility robustness and reliability can cope with most
modern requirements of the non-invasive inspection of objects and
surfaces both smooth or rough. In this communication we will present a
brief review of the work done at the Microtopography Laboratory of the
Physics Department of the University of Minho, Portugal, on the optical
triangulation based microtopographic inspection of surfaces.
SPIE Fellow/NSTDA Research Fellow
National Electronics and Computer Technology Center
National Science and Technology Development Agency
Ministry of Science and Technology ,THAILAND
"Optical metrology in agriculture"
Abstract:Optics and photonics can play a very significant role in precision agriculture. Especially, optical imaging and optical spectroscopy once combined with other disciplinary such as electronics, mechanical, and computer engineering can lead to optical sensing systems highly suitable for agriculture applications. Highlights in this talk include modules and systems that are already deployed in for rice fields, shrimp farms, and silk industry.
Dr.Gao Wei, Tohoku University, Japan
Wei Gao received his Bachelor of Precision Instrumentation from Shanghai Jiao Tong University, China, in 1986, followed by MSc and Ph. D from Tohoku University, Japan, in 1991 and 1994, respectively. He is currently a professor and the director of Research Center for Precision Nanosystems, Department of Nanomechanics of Tohoku University. He has been working in the field of precision engineering, specialized in precision metrology and micro/nano-metrology. He has developed a number of surface form measurement systems as well as several sensor technologies for precision positioning. He is a fellow of CIRP, and a fellow of the International Society for Nanomanufacturing. He serves as the Chairman of The Scientific Technical Committee Precision Engineering and Metrology of CIRP. He is also a Vice President of the Japan Society for Precision Engineering (JSPE) in the Japanese academic year of 2015. He works in the editorial board of several international journals such as the International Journal of Nanomanufacturing. In addition to the publications of academic papers, he has applied 50 patents (20 issued). He is the author of the book ¡°Precision Nanometrology ¨C Sensors and Measuring Systems for Nanomanufacturing¡± (Springer). He has won five Paper Awards from JSPE.
'"Nanofabrication and applications of large-area microstructured optical elements"
Abstract: Artifacts with surfaces composed of three-dimensional (3D) microstructures are required for calibration, inspection of measuring instruments such as scanning probe microscopes, mechanical stylus profilers and optical microscopes. Recently, new types of optical sensors and optical measuring instruments are also developed by using large-area microstructured artifacts as the reflective and diffractive optical components. This keynote will present nanofabrication and applications of such microstructured artifacts for optical metrology. The technology of fabricating a large-area 3D sinusoidal microstructued surface by using ultra-precision machining based on fast-tool servo will be presented, followed by some nanometrology techniques for compensating the fabrication errors. An in-process fabrication and measurement system called the FS-FTS will then be presented by nanofabrication of large area micro-lens arrays. A multi-axis optical sensor by using large-area micro-structured surfaces as the scales for precision measurement of positions will also be introduced.
Prof. Dr. Ralf B. Bergmann
BIAS - Bremer Institut f¨¹r angewandte Strahltechnik GmbH, Bremen, Germany
Ralf B. Bergmann obtained his doctoral degree in Physics in 1991 at the University of Stuttgart. He worked at the Fraunhofer-Institute for Solar Energy Research in Freiburg, the Max-Planck-Institute for Solid State Research in Stuttgart, the University of Stuttgart, the University of New South Wales in Sydney, Australia and headed the Department of Applied Physics at the corporate research center of the Robert Bosch Corp. near Stuttgart and the quality assurance lab of the business unit Automotive Electronics at the same company in Reutlingen, also in Germany. Since July 2008 he is a professor at the University of Bremen in the Faculty of Physics and Electrical Engineering and director at the Institute of Applied Beam Technology (BIAS) in Bremen, Germany. His activities are centered on optical metrology and optoelectronic systems and cover shape measurement, non-destructive testing, optoelectronic systems including micro and nano-optics and optical design and simulation.
Title "Computational optical metrology"
Abstract: Optical metrology has developed into a key enabler
for essential areas of industrial production and quality control.
Steadily rising demands on products and processes e.g. product
miniaturization, increase of precision, complexity and reliability
require fast, precise, non-destructive and contactless test and
measurement processes, which can in many cases best be realized using
A great challenge for metrology systems arises from the combination of requirements such as high measurement speed, low measurement uncertainty and tolerance with respect to adverse measurement conditions. The later may stem from mechanical vibrations, uncooperative surfaces or an adverse surface topology. To give an example: Measuring a surface profile with an area of 1 square cm at intervals of 1 micro meter per second in the presence of vibrations that causes the optics of the measurement system to be accelerated with 1 g at 10 Hz and having the requirement to keep the shape deviation of the products below 0.5 micro meter requires to capture 100 million data points per second with a maximum measurement uncertainty of 50 nm at a maximum vibration amplitude of about 2 mm at 10 Hz. If, in addition, the object has a surface topography that does not allow a complete observation from one position, several light sources or several optical systems may be necessary to capture the light required to determine the complete shape of the object under investigation.
Meeting these challenges requires novel approaches for optical metrology systems. In order to highlight the need for a synergetic treatment of the capture of optical information and its computational treatment to enable optical metrology under challenging conditions, we introduce the concept of Computational Optical Metrology.
Dr. Leslie L. Deck,Zygo Corporation
Dr. Leslie L. Deck is a Technology Fellow at Zygo Corporation, located in Middlefield, Connecticut. ZYGO designs, develops, manufactures and markets high-performance optical measuring instruments and precision optical components. Dr. Deck is a Particle Physics Ph.D. who has been working in the optical sciences for 25 years, holds 50 patents and has published over 40 papers in optical metrology, primarily in the field of interferometry and its application to distance measurement and surface profiling
Title: ¡°Modern high precision interferometric testing of optical components¡±
Abstract: Optical interferometry is widely used for surface topography measurements thanks to its precision, flexibility and ease of use. However, the precision of interferometry also makes measurements sensitive to uncontrolled error sources. Modern interferometric testing instruments are designed to deliver high performance in the presence of these imperfect conditions, which include vibration, air turbulence, stray light, aberrations, improper focus and operator error. These advances have enabled significant improvements in measurement robustness, repeatability, fidelity and lateral resolution. Here I review techniques in current use for surface form and waviness metrology of optical components, as well as perspectives on future developments.
Prof. Dr. Xiang Peng, College of Optoelectronics Engineering, Shenzhen University, China
Prof. Dr. Xiang Peng received his B.S., M.S., and Ph.D. from Tianjin University in 1981, 1984, and 1989, respectively, all in Optical Engineering. His doctorate dissertation involved in laser speckle statistics and its application to velocimetry with a photo-counting technique. From July 1985 to July 1986, he is a visiting scholar at the Department of Electrical and Electronic Engineering, University of Huston, TX, USA. From August 1990 to June 1992, Dr. Peng was awarded a fellowship by Alexander von Humboldt Foundation, Germany. He worked with Institute of Applied Optics (ITO) at University of Stuttgart as an Alexander von Humboldt Fellow. Dr. Peng¡¯s research activities at ITO involved in electronic speckle pattern interferometry and its application to 3D contouring. Since October 1984, Xiang Peng has been with Tianjin University as Assistant Professor, Associate Professor (1992), and Full Professor (1998). He has joined Shenzhen University in January, 2003 and has been keeping his position as Adjunct Professor at Tianjin University. Dr. Peng has also been Adjunct Professor since 2007 at Clemson University, NC, USA. Prof. Peng held several visiting positions at University of Calgary, CA, in 1999 and at the Hong Kong University of Science and Technology (HKUST) in 1996, 1998, 2001, respectively. Dr. Peng¡¯s research work in Calgary involved in Reverse Engineering with help of 3D imaging and Modeling, and his research activities at HKUST involved in Optical Security. Prof. Peng¡¯s current research interests include Optical Imaging, Metrology, and Optical Security. Prof. Peng has numerous publications in refereed journals and was awarded more than 20 inventions wherein ten of patents have been transferred to ESUN Co. Ltd., a listed company in Shenzhen. He also serves as the Director of Engineering Laboratory for 3D imaging and modeling of Shenzhen Government and senior technical consultant at ESUN Co. Ltd. At the College of Optoelectronics Engineering (COE) of Shenzhen University, Prof. Dr. Xiang Peng is leading a research group to conduct researches in the areas of 3D imaging and modeling, optical security, and phase-optics based imaging and display. Prof. Peng¡¯s research activities have been supported by Natural Science Foundation of China (NSFC), Sino-German Center for Research Promotion (SGCRP), the Natural Science Foundation of Local Governments of Guangdong Province and Shenzhen city, and Industrial Sectors.
Title: ¡°3D Imaging and modeling: a bridge from physical world to digital world¡±
Abstract: The technology for optical imaging and modeling can be served as a bridge from physical world to virtual world. A single optical digitizer or 3D optical sensor network composed of multiple node sensors can be regarded as kinds of optical instruments that works on the principle of computational imaging. In order to reconstruct 3D image it is necessary to decode the fringe pattern to get the phase map that acts as special marks encoding each point of test object or scene, resulting in accurate determination of point correspondence. Once the homologous pairs identified precisely a 3D image can be obtained through a series of computations. This presentation will talk about an optical digitizer based on the strategy of phase-aided active stereo (PAAS) which has been widely applied in many practical applications, including reverse engineering, industrial inspection, plastic surgery, etc. Furthermore, multiple PAAS-based optical digitizers can be used to construct a measurement network, which will be very useful for garment industry, body measurement, and electronic commerce. This talk will also address some important issues involved in such a measurement network. In addition, some typical case studies will also be presented to show great potentials of 3D optical digitizer based on the PAAS strategy and PAAS-based optical measurement network.
Arizona Optical Metrology LLC,United States
Dr. Chunyu Zhao is Co-founder and President of Arizona Optical Metrology LLC (www.cghnulls.com), a company that provides computer generated holograms (CGH) for testing aspheric surfaces, as well as a stitching software package called ZBR. He is also an adjunct faculty member at the University of Arizona, College of Optical Sciences. He got B.S. in physics and B.E. in mechanical engineering in 1993 from Tsinghua University, Beijing, China, and M.S. in 1999 and PhD in 2002, both in optical engineering from the University of Arizona. Dr. Zhao has over 15 years¡¯ experience in design, development, and build of interferometric systems for testing large aspheric optical surfaces. Dr. Zhao has authored/co-authored about 70 technical papers and presented dozens of talks at international conferences.
"Computer Generated Holograms for optical testing ¨C a review of historical and recent developments"
Abstract: Computer Generated Hologram or CGH, in combination with a laser interferometer, is the de facto standard for precision measurement of aspheric surfaces or wavefronts. In this talk I first give a review of the historical development of the CGH technology, following the time line from the first publication on the concept of holography, to the creations of the first laser holograms, to the idea and realizations of holograms generated by computer, up to the research, development and application of the CGH technology for optical testing. As the technology gets widely accepted, more innovations happened in areas of CGH fabrication pushing the technology envelope, as well as creative use of the CGH to do the previously unthinkable. I will give a few examples in each area.
Prof. Yu-Lung Lo (Á_Ô£ýˆ)
Department Head, Distinguished Professor, Department of Mechanical Engineering
National Cheng Kung University (NCKU), Micro Opto-Electronics Sensor Laboratory
Chairman, Asian Society of Experimental Mechanics (ASEM)
Title:"Advanced Photonics for Remote Sensing and Communications using Femtosecond Laser Pulses"
Dr.Fengzhou Fang,Tianjin University ,China¡¡
Tong Cunzhu, Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP),China
Cunzhu Tong, received the B.S. and M.S. degrees in physics from Chongqing University, Chongqing, China, and the Ph.D.degree from the Institute of Semiconductors, Chinese Academy of Sciences (CAS), Beijing, China. He was a research fellow with Nanyang Technological University (NTU), Singapore, from 2005 to 2009. After that he joined the Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, Canada, as a post-doctoral researcher. He became the professor of Hundred Talents Program in CAS in 2010 and was with the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP), CAS, Changchun, China. He was the distinguished elite professor of CAS since 2015 and the standing committee member of Chinese Society Astronautics since 2013. He is the deputy director of State Key Lab of Luminescence and Applications, and also a reviewer of the National Key Research and Development Plan of China. He won several awards including the outstanding young scientist award, Person of the Year 2012, selected by SCIENTIFIC CHINESE, the Excellent Award for Hundred Talents Program of CAS and the Important Achievements in China Optics 2015 etc. He has authored and co-authored over 80 refereed journal papers. His current research interests include the photonic crystal semiconductor lasers, beam shaping and combining of semiconductor lasers and the semiconductor disk lasers.
Title: ¡°Beam Control and Power Scaling of Diode Lasers¡±
Abstract: Diode lasers show many advantages including the high electro-optical efficiency, small volume, low weight, long lifetime and low cost, but the disadvantages such as large divergence, oval-shaped beam and the relative low-power as the direct source for industry still affect their applications. In this talk, I will introduce our works on how to control the beam shape, divergence in fast- and slow-axis of laser diodes using photonic bandgap principle and microstructures. The power scaling of laser diodes based on the beam shaping and combining approaches using the diffraction optical elements is also given. The developing trends and the competition of direct diode lasers with the solid state lasers and fiber lasers are also discussed.
Dr. Yang Yu, Taylor Hobson Ltd, UK
Fast and precise 3D form error characterisation of aspheric optics
Abstract: A method for non-contact 3D form measurement of aspheric surfaces is presented. The principle is based on Multi Wavelength Interferometry (MWLI). This scanning interferometer can quickly provide complete and precise 3D form error analysis with high data density at high accuracy in a short measurement time. The system allows complete geometric inspection of aspheres without restrictions in terms of spherical departures. It can measure a wide range of special optics including annular lenses, segmented, ground and discontinued optics, small and thin optics, slight freeform optics and even structured optics with a high aspect ratio such as Fresnel lenses. The optics can be polished or ground and can be made of opaque or transparent materials. The system is robust against external vibrations and can be used on the shop floor.
Prof. Chao Zuo, Smart Computational Imaging Laboratory (SCILab), Department of Electronic and Optical Engineering, Nanjing University of Science and Technology (NUST), China
Chao Zuo is a professor at the department of Electronic and Optical Engineering, Nanjing University of Science and Technology (NUST). He received his Ph.D. and B.S. from Nanjing University of Science and Technology in 2014 and 2009. He was a research assistant at Centre for Optical and Laser Engineering (COLE), Nanyang Technological University (NTU), Singapore, from 2012 to 2014. Now he is the principal investigator of the Smart Computational Imaging Laboratory (SCILab) at NUST where the research interest focuses on computational imaging, phase retrieval, optical information processing, and high-speed 3D optical sensing. He has published over 40 papers in peer-reviewed journals with total citation over 700 times according to Google Scholar.
"Computational microscopy with programmable illumination and coded aperture"
Abstract:Computational microscopy is an emerging technology which extends the capabilities of optical microscopy with the combination of optical coding and computational decoding. It provides us with novel imaging functionalities or improved imaging performance which are difficult or impossible to achieve using a conventional microscopic system. Recent advance in LED lighting and digital display technology provide new opportunities for active digital illumination and imaging control for advancing microscopy. In this talk, we report our most recent developments of computational microscopy with programmable illumination and coded aperture. We describe several new approaches for achieving multi-modal computational imaging, including contrast-enhancement imaging, quantitative phase imaging, light field imaging, giga-pixel high-resolution imaging and lens-less tomographic imaging, with use of a programmable LED array or a programmable LCD panel.